Electron Microscopy and Analysis

1 Microscopy With Light And Electrons 1 -- 1.2 Methods Of Image Formation 2 -- 1.3 Pixels 3 -- 1.4 Light-optical Microscope 4 -- 1.5 Magnification 7 -- 1.6 Resolution 8 -- 1.7 Depth Of Field And Depth Of Focus 12 -- 1.8 Aberrations In Optical Systems 14 -- 1.9 Electrons Versus Light 16 -- 2 Electrons And Their Interaction With The Specimen 20 -- 2.2 Electrons 20 -- 2.3 Generating A Beam Of Electrons 24 -- 2.4 Deflection Of Electrons--magnetic Lenses 27 -- 2.5 Scattering Of Electrons By Atoms 29 -- 2.6 Elastic Scattering 30 -- 2.7 Inelastic Scattering 31 -- 2.8 Secondary Effects 34 -- 2.9 Family Of Electron Microscopes 37 -- 3 Electron Diffraction 40 -- 3.1 Geometry Of Electron Diffraction 41 -- 3.2 Diffraction Spot Patterns 47 -- 3.3 Use Of The Reciprocal Lattice In Diffraction Analysis 51 -- 3.4 Other Types Of Diffraction Pattern 58 -- 4 Transmission Electron Microscope 66 -- 4.1 Instrument 66 -- 4.2 Contrast Mechanisms 76 -- 4.3 High Voltage Electron Microscopy (hvem) 108 -- 4.4 Scanning Transmission Electron Microscopy (stem) 110 -- 4.5 Preparation Of Specimens For Tem 110 -- 5 Scanning Electron Microscope 122 -- 5.1 How It Works 122 -- 5.2 Obtaining A Signal In The Sem 124 -- 5.3 Optics Of The Sem 131 -- 5.4 Performance Of The Sem 133 -- 5.5 Ultimate Resolution Of The Sem 135 -- 5.6 Topographic Images 141 -- 5.7 Compositional Images 146 -- 5.8 Crystallographic Information From The Sem 149 -- 5.9 Use Of Other Signals In The Sem 153 -- 5.10 Image Acquisition, Processing And Storage 159 -- 5.11 Preparation Of Specimens For Examination In The Sem 162 -- 5.12 Low Voltage Microscopy 164 -- 5.13 Environmental Scanning Electron Microscopy (esem) 166 -- 6 Chemical Analysis In The Electron Microscope 169 -- 6.1 Generation Of X-rays Within A Specimen 170 -- 6.2 Detection And Counting Of X-rays 174 -- 6.3 X-ray Analysis Of Bulk Specimens 184 -- 6.4 X-ray Analysis Of Thin Specimens In The Tem 193 -- 6.5 Quantitative Analysis In An Electron Microscope 196 -- 6.6 Electron…